FIB hands-on training
Trainees will learn the basics of SEM and FIB, including electron beam lithography, chip cross-section analysis, EDS and STEM. The training also covers 3D FIB tomography at the nanometre scale and includes hands-on FIB work under instructor supervision.
Level
Advanced
Delivery Mode
In person
Language
English
Dates
12 Oct 2026 – 23 Oct 2026
Duration
30
Learning hours
0
ECTS
0.00
ECVET
0.00
Seats
Limited (1)
Location
Nanocenter, Jamova cesta 39, 1000 Ljubljana, Slovenia
Fees
0
Delivered by
CC Chip.si
Chips Competence Centre
CC Chip.si
Certification Type
Certificate of Attendance
Target Audience
Graduate students
Pre-requisites
Students should have prior experience with electron microscopy and/or have completed a graduate- or PhD-level course in electron microscopy.
Categories
Characterization and Test
Registration Contact
Register Now
aCCCess has received funding from the European Union’s Digital Europe Chips JU under Grant Agreement No 101217840.
Funded by the European Union. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or [name of the granting authority]. Neither the European Union nor the granting authority can be held responsible for them.