Expert Metrology Course
Advanced characterization and metrology measurement methods for semiconductor materials, structures and devices. The course brings together experts in semiconductor characterization to share their knowledge and practical experience with researchers, academics and PhD students.
Level
Advanced
Delivery Mode
In person
Language
English
Dates
10 Dec 2026 – 11 Dec 2026
Duration
2 days
Learning hours
0
ECTS
0.00
ECVET
0.00
Seats
Limited (30)
Location
National University of Science and Technology POLITEHNICA Bucharest, Splaiul Independentei 313, Sector 6, Bucharest, ROMANIA
Fees
no fee
Delivered by
Center for Surface Science and Nanotechnology (CSSNT)
Pilot Line
NanoIC
Certification Type
Certificate of Attendance
Target Audience
Mid-career professionals
Pre-requisites
knowledge of advanced semiconductor technologies and related processes
Categories
Characterization and Test
Registration Contact
Register Now
aCCCess has received funding from the European Union’s Digital Europe Chips JU under Grant Agreement No 101217840.
Funded by the European Union. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or [name of the granting authority]. Neither the European Union nor the granting authority can be held responsible for them.