/Analog/Mixed-Signal Test and Design-for-Test for Integrated Circuits training

Analog/Mixed-Signal Test and Design-for-Test for Integrated Circuits training

Analog and mixed-signal (A/MS) ICs require different testers than for digital ICs, as well as different DfT techniques. This course teaches the principles of practical A/MS DfT and test, and the imminent IEEE standards that facilitate systematic solutions now and eventually much more automation.

Level
Intermediate
Delivery Mode
In person
Language
English
Dates
Expected June 2026
Duration
3 afternoons
Seats
unlimited
Location
Eindhoven
Fees
1,145
Delivered by
High Tech Institute
Competence Centre
ChipNL CC
Certification Type
Certificate of Attendance
Target Audience
Mid-career professionals
Pre-requisites
This course is intended for those involved in DfT and test of A/MS ICs: Analog / mixed-signal IC design engineers, test and product engineers, and DfT engineers. Also: test researchers, test methodology developers, test tool developers, and their managers!
Categories
Quality and ReliabilityCharacterization and Test
Registration Contact
Register Now
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aCCCess has received funding from the European Union’s Digital Europe Chips JU under Grant Agreement No 101217840.

Funded by the European Union. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or [name of the granting authority]. Neither the European Union nor the granting authority can be held responsible for them.