/Characterization of Superconducting, Semiconducting and Emergent Devices and Samples

Characterization of Superconducting, Semiconducting and Emergent Devices and Samples

Course will provide training in sample preparation, cryogenic and vacuum system handling, and transport measurements at cryogenic temperatures. Course will cover basic 2-point and 4-point resistance measurements as well as advanced magnetoresistance measurements.

Level
Advanced
Delivery Mode
In person
Language
English
Duration
24 hours
Learning hours
0
ECTS
0.00
ECVET
0.00
Seats
Limited (6)
Location
Nanocenter, Jamova cesta 39, 1000 Ljubljana, Slovenia
Fees
0
Delivered by
CC Chip.si
Chips Competence Centre
CC Chip.si
Certification Type
Certificate of Attendance
Target Audience
Graduate students
Pre-requisites
Basic knowledge of electronics, solid-state physics or experimental physics
Categories
Characterization and TestQuantum
Registration Contact
Register Now
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aCCCess has received funding from the European Union’s Digital Europe Chips JU under Grant Agreement No 101217840.

Funded by the European Union. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or [name of the granting authority]. Neither the European Union nor the granting authority can be held responsible for them.