Online workshop on Focused Ion Beam (FIB)
Learn the fundamentals of scanning electron microscopy (SEM) and focused ion beam (FIB) techniques. Explore applications such as cross-section analysis, defect inspection, contact deposition, structure etching, 3D tomography, e-beam lithography, and lamella preparation.
Level
Intermediate
Delivery Mode
Online
Language
English
Dates
9 Jun 2026 – 9 Jun 2026
Duration
3 Hours
Learning hours
0
ECTS
0.00
ECVET
0.00
Seats
unlimited
Location
Online
Fees
0
Delivered by
CC Chip.si
Chips Competence Centre
CC Chip.si
Certification Type
Certificate of Attendance
Target Audience
Graduate students
Pre-requisites
Everyone interested in electron microscopy, especially SEM and FIB
Categories
Characterization and TestManufacturingMaterials
Registration Contact
Register Now
aCCCess has received funding from the European Union’s Digital Europe Chips JU under Grant Agreement No 101217840.
Funded by the European Union. Views and opinions expressed are however those of the author(s) only and do not necessarily reflect those of the European Union or [name of the granting authority]. Neither the European Union nor the granting authority can be held responsible for them.